Automated detection of fatigue cracks around fasteners using millimeter waveguide probe

ABSTRACT

An automated high-speed method for inspecting metal around fasteners and a computer-controlled apparatus for performing that inspection method. The apparatus comprises a multi-motion inspection head mounted on a scanning bridge, a robotic arm, or a robotic crawler vehicle. The multi-motion inspection head comprises a millimeter waveguide probe and a motorized multi-stage probe placement head that is operable for displacing the waveguide probe along X, Y and Z axes to achieve multiple sequenced motions. The waveguide probe is attached to a mandrel that is rotatably coupled to an X-axis (or Y-axis) stage for rotation about the Z axis. Smart servo or stepper motors with feedback control are used to move the waveguide probe into place and then scan across or around a fastener head to inspect for cracks that may be under paint.

RELATED PATENT APPLICATION

This application is a divisional of and claims priority from U.S. patentapplication Ser. No. 14/738,359 filed on Jun. 12, 2015, which issued asU.S. Pat. No. 10,168,287 on Jan. 1, 2019.

BACKGROUND

This disclosure generally relates to apparatus and methods fornon-destructive inspection (NDI) of structural elements and, moreparticularly, relates to NDI techniques for detecting fatigue cracksaround fasteners.

Non-destructive detection and evaluation of stress-induced fatiguecracks in metals may be practiced in many different environments,including surface transportation, aerospace transportation and powerplants. For example, eddy current testing may be used to identify cracksthat may not be visible. In some cases, paint may be removed to performan inspection. Some paints or coatings have a conductive material thatmay make it more difficult to identify cracks when eddy current testingis used. Eddy current testing uses electromagnetic induction to identifycracks in conductive materials, such as metal skin panels. Inparticular, eddy current testing near features, such as fasteners, isaffected by the electrical conductivity differences between thestructure and the fastener. This difference may limit the sensitivity ofthis type of testing to detect inconsistencies. These types ofinspections may require more time and expense than desired.

Another known technique for detecting cracks in metals uses a near-fieldmillimeter wave (i.e., a wavelength range of 1-10 mm) waveguide probe.Millimeter wave signals do not penetrate through metals but aresensitive to the presence of metal surface discontinuities such ascracks. Advantageously, millimeter wave signals are able to propagatethrough dielectric materials, such as paint. Thus a waveguide probe caninterrogate paint-covered metal surfaces. If a crack is present in theinterrogated volume, the crack will produce a perturbation in thesurface current density induced in the waveguide probe.

A known method of detecting cracks in metal around fasteners uses ahand-held waveguide probe. It would be desirable to provide an automatedapparatus capable of performing millimeter wave crack detection,enabling crack detection that is faster, less labor intensive, morerepeatable, and ergonomically safer than using a hand-held waveguideprobe.

SUMMARY

The subject matter disclosed in detail below is directed to an automatedhigh-speed method for inspecting metal around fasteners and acomputer-controlled apparatus for performing that inspection method. Inaccordance with various embodiments, the apparatus comprises amulti-motion inspection head mounted on a scanning bridge, an end of arobotic arm, or a robotic crawler vehicle. The multi-motion inspectionhead comprises a millimeter waveguide probe and a motorized multi-stageprobe placement head that is operable for displacing the waveguide probealong X, Y and Z axes to achieve multiple sequenced motions. Thewaveguide probe is attached to a mandrel that is rotatably coupled to anX-axis (or Y-axis) stage for rotation about the Z axis. Smart servo orstepper motors with feedback control are used to move the waveguideprobe into place and then scan across or around a fastener head toinspect for cracks that may be under paint, extending outward from thefastener.

In accordance with one embodiment, the apparatus comprises variousdirectional motorized stages that are sequenced and controlled for thespecific motions needed to inspect fastener rows on aircraft fuselages.In alternative embodiments, the motorized stages can be sequenced andcontrolled for the specific motions needed to inspect fasteners onstructures found in the nuclear power plant, oil drilling, shipbuildingand transportation industries.

In accordance with one inspection method, the scanning bridge, roboticarm, or crawler vehicle can be operated to move the waveguide probe to alocation proximate to a first fastener or between first and secondfasteners. While the scanning bridge, robotic arm, or crawler vehicle isinactive, the motorized multi-stage probe placement head can be operatedto move the waveguide probe to a precise location overlying the firstfastener, lower the waveguide probe to the inspection height, and thenrotate or translate the waveguide probe during scanning of the areaaround the first fastener. After scanning of the first fastener has beencompleted, the motorized multi-stage probe placement head can beoperated to move the waveguide probe to a precise location overlying thesecond fastener, where the foregoing process is repeated. After scanningof the second fastener has been completed, the scanning bridge, roboticarm, or crawler vehicle can be operated to move the waveguide probe to alocation proximate to a third fastener or between third and fourthfasteners. Then the motorized multi-stage probe placement head can beoperated to enable scanning of the areas around the third and fourthfasteners. All of the movements are controlled by a control computer.

In accordance with one embodiment, the control computer is programmed toperform fully automated inspection of fastener cracks on an aluminumskin of an aircraft fuselage, with the Z axis being parallel with theaxis of the fastener. However, it should be appreciated that theautomated apparatus and methods disclosed herein are suitable forinspection of metallic structures other than metallic aircraftfuselages.

One aspect of the subject matter disclosed in detail below is anapparatus for non-destructive inspection of metal around a fastener,comprising: a platform; a multi-stage probe placement head comprising ablock assembly attached to the platform and first through third stages,the first stage being translatably coupled to the block assembly fortranslation along a first axis, the third stage being translatablycoupled to the first stage for translation along a second axisorthogonal to the first axis, and the second stage being translatablycoupled to the third stage for translation along a third axis orthogonalto the first and second axes; a mandrel rotatably coupled to the secondstage of the multi-stage probe placement head for rotation about thefirst axis; and a waveguide probe attached to the mandrel. The platformmay be a crawler vehicle, a scanning bridge or a robotic arm. Theapparatus may further comprise a camera mounted to the platform, thecamera being directed toward a volume of space under the multi-stageprobe placement head. In the disclosed embodiments, the apparatusfurther comprises first through third motors mechanically coupled to thefirst through third stages respectively, and a fourth motor mechanicallycoupled to the mandrel, wherein the first stage will translate relativeto the block assembly when the first motor is activated, the third stagewill translate relative to the first stage when the third motor isactivated, the second stage will translate relative to the third stagewhen the second motor is activated, and the mandrel will rotate relativeto the second stage when the fourth motor is activated.

Another aspect of the subject matter disclosed herein is an apparatusfor non-destructive inspection of metallic structure around a fastener,comprising: a platform; a multi-stage probe placement head comprising ablock assembly attached to the platform, a first stage which istranslatable relative to the block assembly along a first axis, and asecond stage which is translatable relative to the block assembly alonga second axis orthogonal to the first axis; a mandrel rotatably coupledto the second stage of the multi-stage probe placement head for rotationabout the first axis; and a waveguide probe attached to the mandrel.

A further aspect of the disclosed subject matter is a method fornon-destructive inspection of metal around a fastener, comprising: (a)moving a platform to a position whereat a waveguide probe movablycoupled to the platform is in proximity to a fastener; (b) while theplatform and waveguide probe are stationary, acquiring image data usinga camera having a field of view that includes the fastener; (c)processing the image data to determine a location of the fastener in aframe of reference of the platform; (d) determining a difference betweenthe current position and a start position of the waveguide probe in theframe of reference of the platform; (e) while the platform isstationary, moving the waveguide probe from the current position to thestart position of the waveguide probe; and (f) while the platform isstationary, scanning at least a portion of an area around the fastenerusing the waveguide probe, scanning being started while the waveguideprobe is in the start position.

In accordance with some embodiments of the method described in thepreceding paragraph, a vertical axis midway between two apertures of thewaveguide probe is approximately coaxial with a vertical axis through acenter of the fastener when the waveguide probe is in the startposition. In those embodiments, step (f) comprises rotating thewaveguide probe.

In accordance with other embodiments, a vertical axis midway between twoapertures of the waveguide probe is separated from a vertical axisthrough a center of the fastener when the waveguide probe is in thestart position. In accordance with one embodiment, step (f) comprisestranslating the waveguide probe in a horizontal direction so that thevertical axis of the waveguide probe moves in a vertical plane whichintersects the fastener. In accordance with another embodiment, step (f)comprises translating the waveguide probe horizontally so that thevertical axis of the waveguide probe follows a serpentine path in anarea that includes the fastener.

Another aspect of the subject matter disclosed below is a method fornon-destructive inspection of metal around a fastener, comprising: (a)moving a platform to a position whereat a waveguide probe movablycoupled to the platform is in proximity to a fastener; (b) while theplatform is stationary, moving the waveguide probe along a serpentinepath that passes over the fastener; (c) while the waveguide probe ismoving along the serpentine path, scanning an area around the fastener;(d) collecting wave signals from the waveguide probe; and (e) processingthe collected wave signals to determine if those wave signals indicatethe presence of a crack in the area around the fastener.

Yet another aspect of the subject matter disclosed in detail below is asystem for non-destructive inspection of metal around a fastener,comprising: a platform comprising a plurality of movable parts and afirst plurality of motors respectively mechanically coupled to themovable parts; a multi-stage probe placement head attached to theplatform, the multi-stage probe placement head comprising an X-axisstage, a Y-axis stage and a Z-axis stage, the X-, Y- and Z-axis stagesbeing respectively translatable in X, Y and Z directions; a secondplurality of motors respectively mechanically coupled for drivingtranslation of the X-, Y- and Z-axis stages; a waveguide probe rotatablycoupled to the third stage of the multi-stage probe placement head, thewaveguide probe being rotatable about the Z axis; a motor mechanicallycoupled for driving rotation of the waveguide probe about the Z axis; acamera mounted to the platform, the camera being directed toward avolume of space under the multi-stage probe placement head; and acomputer system programmed to perform the following operations:processing imaging data acquired by the camera; controlling the motors;and controlling the waveguide probe to transmit wave signals. Theplatform may be a crawler vehicle, a scanning bridge or a robotic arm.The operation of processing imaging data acquired by the cameracomprises recognizing imaging data representing an image of a fastenerand then determining a position of the fastener in a frame of referenceof the platform.

In accordance with some embodiments of the system described in thepreceding paragraph, the operation of controlling the motors comprisesactivating and later de-activating at least one of the second pluralityof motors to cause the waveguide probe to be moved to a start positionat which a center axis of the waveguide probe intersects the fastener,and activating the motor mechanically coupled for driving rotation ofthe waveguide probe about the Z axis while the waveguide probe is in thestart position, and wherein the operation of controlling the waveguideprobe to transmit wave signals comprises activating the waveguide probeto transmit wave signals while the waveguide probe is rotating.

In accordance with other embodiments of the system, the operation ofcontrolling the motors comprises activating and later de-activating atleast one of the second plurality of motors to cause the waveguide probeto be moved to a first start position at which a central axis of thewaveguide probe is not coaxial with a central axis of the fastener, andthen activating and later de-activating the motor of the secondplurality of motors which is mechanically coupled for drivingtranslation of the Y-axis stage to cause the waveguide probe totranslate in a first Y direction from the first start position to afirst stop position, and the operation of controlling the waveguideprobe to transmit wave signals comprises activating the waveguide probeto transmit wave signals while the waveguide probe is moving from thefirst start position to the first stop position.

In a variation of the embodiments described in the preceding paragraph,the operation of controlling the motors further comprises activating andlater de-activating the motor of the second plurality of motors which ismechanically coupled for driving translation of the X-axis stage tocause the waveguide probe to translate in an X direction from the firststop position to a second start position, and thereafter activating andlater de-activating the motor of the second plurality of motors which ismechanically coupled for driving translation of the Y-axis stage tocause the waveguide probe to translate in a second Y direction oppositeto the first Y direction from the second start position to a second stopposition, and the operation of controlling the waveguide probe totransmit wave signals further comprises activating the waveguide probeto transmit wave signals while the waveguide probe is moving from thesecond start position to the second stop position.

Other aspects of apparatus and methods for automated millimeter wavecrack detection are disclosed below.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram representing a side view of a crawler vehiclecarrying a waveguide probe for detecting cracks around fasteners inaccordance with one embodiment.

FIG. 2A is a diagram showing two rows of fasteners and arrows indicatingwaveguide probe movements in accordance with one possibleimplementation. These waveguide probe movements can be used when thecrack direction is not generally known.

FIG. 2B is a diagram showing two rows of fasteners and arrows indicatingwaveguide probe movements in accordance with another possibleimplementation. These waveguide probe movements can be used when thecrack direction is not generally known.

FIG. 3 is a diagram showing two rows of fasteners and arrows indicatingwaveguide probe movements in accordance with a third possibleimplementation. These waveguide probe movements can be used when thecrack direction is along the fuselage of an aircraft.

FIG. 4 is a diagram showing two rows of fasteners and arrows indicatingwaveguide probe movements in accordance with a fourth possibleimplementation. These waveguide probe movements, which includeraster-type scanning, can be used when the crack direction is along thefuselage of an aircraft.

FIG. 5 is a block diagram identifying components of a millimeter wavecrack detection system.

FIG. 6 is a diagram representing an elevation view of a waveguide probesuitable for mounting on a crawler vehicle.

FIG. 7 is a diagram representing a plan view of a crack emanating from afastener in a lap joint portion of a metallic skin.

FIG. 8 is a diagram representing a sectional view of a crack emanatingfrom a fastener in a lap joint portion of a metallic skin.

FIG. 9 is a diagram illustrating movement of an open-ended waveguideprobe over a fastener in accordance with one embodiment.

FIG. 10 is a diagram illustrating signals of a type that might beproduced by a waveguide probe while scanning a fastener.

FIG. 11 is a diagram illustrating scanning of a structure having twocracks emanating from a fastener.

FIG. 12 is a flowchart identifying steps of a process for inspecting astructure in accordance with one embodiment.

FIG. 13 is a diagram representing an isometric view of parts of aholonomic-motion crawler vehicle that could be adapted to carry amulti-motion inspection head. The connections for supplying electricalpower and signals for controlling vehicle motion are not shown.

FIG. 14 is a diagram representing a bottom view of a Mecanum-wheeledcrawler vehicle having dual suction zones.

FIG. 15 is a block diagram identifying components of a system fornon-destructive inspection of metal around a fastener in accordance withone embodiment.

Reference will hereinafter be made to the drawings in which similarelements in different drawings bear the same reference numerals.

DETAILED DESCRIPTION

Various embodiments and implementations will be described with referenceto millimeter wave detection of cracks around fasteners in metalaircraft fuselages. However, it should be appreciated that the apparatusand methods disclosed in detail below can also be used to detect othertypes of incongruities around fasteners. It should be furtherappreciated that the apparatus and methods disclosed in detail below canalso be used to detect incongruities (such as cracks) in other types ofmetal structures, such as components of nuclear power plants, ships,trains, oil drilling probe placement heads, and so forth.

FIG. 1 is a diagram representing a side view of a crawler vehicle 120having a multi-stage probe placement head 100 mounted on its forward endin accordance with one embodiment. The multi-stage probe placement head100 supports a waveguide probe 504, which can be used to detect cracksin metal structure around a fastener. In the example depicted in FIG. 1,the object being inspected is a fuselage skin 506 comprises overlappingmetallic layers 104 and 106 which are fastened together by amultiplicity of fasteners. The fasteners are typically arranged in rows.Only one fastener 702 is shown in FIG. 1. The fastener 702 is secured inaligned holes in layers 104, 106 by means of a collar. The waveguideprobe 504 is shown in a position suitable for inspecting the area aroundthe fastener 702, i.e., a center axis of the waveguide probe 504 iscoaxial with a center axis of the fastener 702. During an inspectionprocedure, the waveguide probe 504 transmits millimeter wave signalswhich interrogate the metal surrounding the fastener 702. Sincemillimeter wave signals penetrate through dielectric materials, such aspaint, paint-covered metal surfaces can be inspected. The waveguideprobe does not need to be in contact with the surface being inspected.

The crawler vehicle 120 may take the form of a remotely operatedvacuum-enabled robot capable of moving along a surface which isnon-horizontal using suction devices (e.g., fans driven by motorsmounted on a frame of the crawler vehicle 120). In the embodimentdepicted in FIG. 1, only two wheels 122 a and 122 b of a set of fourwheels are visible. Rotation of Mecanum type wheels driven by theirrespective motors (not shown) mounted on the frame of the crawlervehicle 120 enable holonomic motion. Holonomic motion, where turning andtranslating are decoupled, enables scanning in any direction within theX-Y plane. The crawler vehicle 120 may be steered for movement in an X-Yplane, with the X axis being parallel to a row of fasteners beinginspected. Movement of the crawler vehicle 120 along a row of fastenersis indicated by the long double-headed arrows labeled “X TRANSLATION” inFIG. 1.

A video camera 190 is mounted on the crawler vehicle 120. The camera canbe oriented so that its field of view will include a volume of spaceunder the multi-stage probe placement head 100. The video camera 190captures imaging data and sends that imaging data to a computer (notshown in FIG. 1). the communication channel between the video camera 190and the computer can be via an electrical cable or wireless. Thecomputer will use the imaging feedback provided by the video camera 190to control precision alignment of the waveguide probe 504 with thefastener 702 to be inspected.

Still referring to FIG. 1, the multi-stage probe placement head 100comprises a block assembly 130 attached to the crawler vehicle 120, aZ-axis stage 140 translatably coupled to the block assembly 130, aX-axis stage 150 translatably coupled to the Z-axis stage 140, and aY-axis stage 160 translatably coupled to the X-axis stage 150. A mandrel170 is rotatably coupled to the Y-axis stage 160. The waveguide probe504 is attached to the mandrel 170, i.e., the mandrel 170 and waveguideprobe 504 rotate in unison. The three stages of the probe placement head100 can be driven by motors for causing the waveguide probe 504 to movein the X, Y or Z directions respectively. The Z-axis stage 140 is usedto raise or lower the waveguide probe 504. The X-axis stage 150 andY-axis stage 160 provide precision motion for centering the waveguideprobe 504 on the fastener 702. The X, Y and Z axes are mutuallyorthogonal axes in the coordinate frame of reference of the crawlervehicle 120. In an ideal inspection scenario, the Z axis of the crawlervehicle 120 will be parallel to the center line of the fastener beinginspected. Multiple motions using smart servo or stepper motors (notshown in FIG. 1) with feedback control (based on imaging data acquiredby video camera 190) are used to precisely position the waveguide probe504 relative to the fastener 702. When proper placement has beenrealized, the waveguide probe 504 can then be translated or rotated toscan across or around the head of the fastener 702 to inspect for cracksin the fuselage skin 506. To enable rotation of the waveguide probe 504,the mandrel 170 can be driven to rotate by a stepper motor (not shown inFIG. 1).

As will be explained in more detail below with reference to FIG. 6, thewaveguide probe 504 comprises a housing 600 which is attached to themandrel 170. A pair of waveguides 602 and 604 have respective proximalends coupled to the housing 600. The waveguides 602, 604 extend inparallel from the housing 600 to the surface of the metal structure tobe inspected. The waveguides 602 and 604 are connected by a bar 612. Thedistal ends of the waveguides 602, 604 have waveguide apertures whichemit millimeter wave signals during rotation or translation of thewaveguide probe 504.

In the scenario depicted in FIG. 1, the millimeter wave signals willpenetrate any dielectric coating on the top surface of the fuselage skin506 and then interrogate the metal around the fastener 702. Crackdetection is based on the perturbation that a crack will produce in thesurface current density induced on the metal skin by the millimeter wavesignals emitted by the waveguide probe 504. The induced surface currenton the metal surface creates a reflected wave and subsequently astanding wave inside the waveguide probe. As will be explained in moredetail below, the presence of a crack inside the waveguide apertureperturbs the surface current density and changes the properties of thereflected and standing waves. Changes in the properties of the standingwave pattern inside the waveguide can indicate the presence of a crack.

The system depicted in FIG. 1 is capable of inspecting the metal aroundfasteners arranged in rows, for example, on an aircraft fuselage, usinga waveguide probe 504 that is moved from fastener to fastener. WhileFIG. 1 shows the waveguide probe 504 aligned with the fastener 702, ingeneral the crawler vehicle 120 will move from one fastener to the nextafter each scan has been completed. When the waveguide probe 504 is inproximity to the next fastener 702, then the video camera 190 capturesimaging data that is used to determine the position of the waveguideprobe 504 relative to the fastener 702. Then X- and Y-stage motors (notshown) on the multi-stage probe placement head 100 can be operated totranslate the waveguide probe 504 in the X and/or Y directions until thewaveguide probe 504 and fastener 702 are aligned. Then the waveguideprobe can be lowered into the start position and the metal around thefastener 702 can be scanned. The sequence of motions may be varied inaccordance with specific implementations to be described in detail belowwith reference to FIGS. 2A, 2B, 3 and 4.

In the scenario depicted in FIG. 1, the waveguide probe 504 is shown ina starting position in which a center line of the waveguide probe 504 isapproximately coaxial with the center line of the fastener 702. Thedouble-headed arrows in FIG. 1 indicate various movements which resultedin the scenario depicted in FIG. 1. First, the crawler vehicle was movedfrom a position where the waveguide probe 504 was not in proximity tothe fastener 702 to a position where the waveguide probe 504 was inproximity to but not yet aligned with the fastener 702 (this position isnot shown in FIG. 1). In the example depicted, the crawler vehicle 120was translated along the X axis, which is parallel to the row offasteners to which fastener 702 belongs. When the fastener 702 waswithin the field of view of the video camera 190, the crawler vehicle120 was commanded to stop. While the crawler vehicle 120 and thewaveguide probe 504 were stationary, the video camera 190 was activatedto acquire image data representing the field of view, which included thehead of the fastener 702. That image data was then processed by acomputer (not shown in FIG. 1) using pattern recognition software todetermine a location of a center line of the fastener 702 in a frame ofreference of the crawler vehicle 120. The computer then used thelocation of the fastener center line to determine a difference betweenthe current position and the start position of the waveguide probe 504in the frame of reference of the crawler vehicle 120. Thereafter, whilethe crawler vehicle 120 was stationary, the waveguide probe 504 wasmoved in the X and/or Y directions from its current position to aposition directly above the start position (movement in the X directionis indicated by the short double-headed arrow labeled “X TRANSLATION” inFIG. 1). Then the waveguide probe 504 was lowered to the start positionby activating the motor (not shown) mechanically coupled to the Z-axisstage 140 (movement in the Z direction is indicated by the shortdouble-headed arrow labeled “Z TRANSLATION”).

In the start position depicted in FIG. 1, the center line of thewaveguide probe 504 is coaxial with the fastener center line. (Inalternative implementations, the start position is selected such thatthe center line of the waveguide probe 504 is spaced apart from thefastener by a short distance.) Then, while the crawler vehicle 120 isstationary, the waveguide probe 504 is activated to scan at least aportion of the area around the fastener 702. Starting at the startposition, the waveguide probe 504 is either rotated (as indicated by thecurved double-headed arrow label “ROTATION”) through a predeterminedangle or translated in the X direction (not indicated in FIG. 1) apredetermined distance. Both waveguides 602 and 604 of the waveguideprobe 504 emit millimeter wave signals toward respective areas near thefastener 702 during the scanning movement. The resulting standing wavesinside the waveguides 602, 604 are detected and then analyzed todetermine whether cracks are present in the metal around the fastener702.

Scanning a row of fasteners by rotating the waveguide probe 504 when itis aligned with and overlying each fastener is especially useful incases where the direction of surface-breaking cracks emanating from thefastener is not generally known. The crawler vehicle (or other platform,such as a scanning bridge or a robotic arm) can be set at the firstfastener in the row, and oriented so it can move along the fastener row.The camera mounted on the platform is used to capture an image of thefastener head. Pattern recognition software can be used to identify thecircular shape of the fastener head and finds its center (i.e., thecenter line of the fastener). The X- and/or Y-axis stages can be drivento adjust the fine position of the waveguide probe so that its centerline is approximately coaxial with the center line of the fastener. Ifneeded, the Z-axis stage is adjusted so that the apertures of thewaveguides are just above the surface of the area around the fastenerhead. Then the waveguide probe can be rotated at least 180 degreesaround the fastener, while the system takes a measurement. All signalsare collected around the fastener. If the area around the fastenerproduces signals above a predetermined threshold, that fastener istagged in the data set for repair and optionally marked with a pen orpaint marker dropped adjacent to the fastener (the threshold isdetermined using a reference standard with a range of cracks). Data(e.g., signal, fastener location number, and data tag indicatingfasteners with crack indications) is collected and stored for retrieval,analysis, or data manipulation, such as gating for maximum signal inorder to size cracks. Then the crawler vehicle (or other platform) movesalong the fastener row to the next fastener. The inspection can be doneone row at a time, covering both rows in two passes. Alternatively,Y-axis movement of the crawler vehicle (or other platform) can enableone pass while scanning both rows on a single lap joint.

FIG. 2A is a diagram showing two rows of fasteners 200 a-200 f. For easeof discussion, it will be assumed that the rows of fasteners aremutually parallel. The straight arrows 210 a-210 g indicate respectivemovements of the waveguide probe (along the X axis) during coarsepositioning (due to movement of the supporting platform; the waveguideprobe is not moving relative to the platform) in accordance with onepossible implementation. The curved arrows 220 a-220 f indicatesuccessive rotations of the waveguide probe at successive positionsoverlying and aligned with the fasteners 200 a-200 f. The finepositioning movements of the waveguide probe, attributable to movementsby one or more stages of the multi-stage probe placement head, are notindicated by arrows in FIG. 2A. These waveguide probe movements can beused when the crack direction is not generally known.

More specifically, steps of a method for scanning two rows of fastenersusing a millimeter waveguide probe, as partially depicted in FIG. 2A,may comprise the following steps.

(1) The platform is translated in a first direction along an X axisparallel to the upper row of fasteners, as indicated by arrow 210 a,until the waveguide probe is positioned in proximity to fastener 200 a.

(2) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 a), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2A).

(3) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 a. This rotation is indicated by arrow 220 a inFIG. 2A.

(4) The platform is translated in the first direction, as indicated byarrow 210 b, until the waveguide probe is positioned in proximity tofastener 200 b in the upper row.

(5) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 b), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2A).

(6) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 b. This rotation is indicated by arrow 220 b inFIG. 2A.

(7) The platform is translated in the first direction, as indicated byarrow 210 c, until the waveguide probe is positioned in proximity tofastener 200 c in the upper row.

(8) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 c), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2A).

(9) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 c. This rotation is indicated by arrow 220 c inFIG. 2A.

(10) The platform is translated in a second direction along the Y axisand perpendicular to the first direction, as indicated by arrow 210 d,until the waveguide probe is positioned in proximity to fastener 200 din the lower row.

(11) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 d), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2A).

(12) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 d. This rotation is indicated by arrow 220 d inFIG. 2A.

(13) The platform is translated in a third direction opposite to thefirst direction, as indicated by arrow 210 e, until the waveguide probeis positioned in proximity to fastener 200 e in the lower row.

(14) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 e), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2A).

(15) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 e. This rotation is indicated by arrow 220 e inFIG. 2A.

(16) The platform is translated in the third direction, as indicated byarrow 210 f, until the waveguide probe is positioned in proximity tofastener 200 f in the lower row.

(17) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 f), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2A).

(18) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 f. This rotation is indicated by arrow 220 f inFIG. 2A.

(19) The platform is translated in the third direction, as indicated byarrow 210 g, until the waveguide probe is positioned in proximity to thenext fastener (not shown in FIG. 2A) in the lower row.

FIG. 2B is a diagram showing two rows of fasteners 200 a-200 f. Thestraight arrows 230 a-230 g indicate respective movements of thewaveguide probe (in the X axis) during coarse positioning (due tomovement of the supporting platform; the waveguide probe is not movingrelative to the platform) in accordance with another possibleimplementation. The curved arrows 220 a-220 f again indicate successiverotations of the waveguide probe at successive positions overlying andaligned with the fasteners 200 a-200 f. The fine positioning movementsof the waveguide probe, attributable to movements by one or more stagesof the multi-stage probe placement head, are not indicated by arrows inFIG. 2B. The method depicted in FIG. 2B differs from the method depictedin FIG. 2A in the order in which the two rows of fasteners areinspected. These waveguide probe movements can be used when the crackdirection is not generally known.

More specifically, steps of a method for scanning two rows of fastenersusing a millimeter waveguide probe, as partially depicted in FIG. 2B,may comprise the following steps.

(1) The platform is translated in a first direction along an X axisparallel to the upper row of fasteners, as indicated by arrow 230 a,until the waveguide probe is positioned in proximity to fastener 200 a.

(2) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 a), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2B).

(3) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 a. This rotation is indicated by arrow 220 a inFIG. 2B.

(4) The platform is translated in a second direction along the Y axisand perpendicular to the first direction, as indicated by arrow 230 b,until the waveguide probe is positioned in proximity to fastener 200 fin the lower row.

(5) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 f), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2B).

(6) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 f. This rotation is indicated by arrow 220 f inFIG. 2B.

(7) The platform is translated in the first direction, as indicated byarrow 230 c, until the waveguide probe is positioned in proximity tofastener 200 e.

(8) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 e), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2B).

(9) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 e. This rotation is indicated by arrow 220 e inFIG. 2B.

(10) The platform is translated in a third direction opposite to thesecond direction, as indicated by arrow 230 d, until the waveguide probeis positioned in proximity to fastener 200 b.

(11) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 b), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2B).

(12) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 b. This rotation is indicated by arrow 220 b inFIG. 2B.

(13) The platform is translated in the first direction, as indicated byarrow 230 e, until the waveguide probe is positioned in proximity tofastener 200 c.

(14) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 c), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2B).

(15) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 c. This rotation is indicated by arrow 220 c inFIG. 2B.

(16) The platform is translated in the second direction, as indicated byarrow 230 f, until the waveguide probe is positioned in proximity tofastener 200 d.

(17) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position (i.e.,aligned with and directly above the fastener 200 d), which adjustmentsmay comprise translation along one or more of the X, Y and Z axes (notindicated by arrows in FIG. 2B).

(18) The waveguide probe is rotated to effect scanning of the areasurrounding fastener 200 d. This rotation is indicated by arrow 220 d inFIG. 2B.

Scanning a row of fasteners by translating the waveguide probe 504 whenit is in proximity to each fastener is especially useful in cases wherethe direction of surface-breaking cracks emanating from the fastener isparallel to a horizontal row of fasteners on a fuselage of an aircraft.The crawler vehicle (or other platform, such as a scanning bridge or arobotic arm) can be set at the first fastener in the row, and orientedso it can move along the fastener row. The camera mounted on theplatform is used to capture an image of the fastener head. Patternrecognition software can be used to identify the circular shape of thefastener head and finds its center (i.e., the center line of thefastener). The X- and/or Y-axis stages can be driven to adjust the fineposition of the waveguide probe so that its center line is approximatelycoaxial with the center line of the fastener. If needed, the Z-axisstage is adjusted so that the apertures of the waveguides are just abovethe surface of the area around the fastener head. Then the waveguideprobe can be translated across the fastener, from one side to the other,with feet passing adjacent to the fastener, while the system takes ameasurement. All signals are collected on both sides of the fastener. Ifthe area around the fastener produces signals above a predeterminedthreshold, that fastener is tagged in the data set for repair andoptionally marked with a pen or paint marker dropped adjacent to thefastener (the threshold is determined using a reference standard with arange of cracks). Data (e.g., signal, fastener location number, and datatag indicating fasteners with crack indications) is collected and storedfor retrieval, analysis, or data manipulation, such as gating formaximum signal in order to size cracks. Then the crawler vehicle (orother platform) moves along the fastener row to the next fastener. Theinspection can be done one row at a time, covering both rows in twopasses. Alternatively, Y-axis movement of the crawler vehicle (or otherplatform) can enable one pass while scanning both rows on a single lapjoint.

FIG. 3 is a diagram showing two rows of fasteners 200 a-200 f. Thestraight arrows 310 a-310 g indicate respective movements of thewaveguide probe during coarse positioning (due to movement of thesupporting platform; the waveguide probe is not moving relative to theplatform) in accordance with another possible implementation. The shortarrows 320 a-320 f indicate successive vertical translations of thewaveguide probe at successive positions overlying and aligned with thefasteners 200 a-200 f. The fine positioning movements of the waveguideprobe, attributable to movements by one or more stages of themulti-stage probe placement head, are not indicated by arrows in FIG. 3.These waveguide probe movements can be used when the crack direction isparallel to a horizontal line of the fuselage of an aircraft.

More specifically, steps of a method for scanning two rows of fastenersusing a millimeter waveguide probe, as partially depicted in FIG. 3, maycomprise the steps listed below. For purposes of this example only, theterm “start scan position” means that the probe center line intersectsor nearly intersects a diametral line which extends across the head ofthe fastener and is perpendicular to the horizontal line of thefuselage.

(1) The platform is translated in a first direction along the X axisparallel to the upper row of fasteners, as indicated by arrow 310 a,until the waveguide probe is positioned in proximity to fastener 200 ain the upper row.

(2) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 a, which adjustments may comprise translation along oneor more of the X, Y and Z axes (not indicated by arrows in FIG. 3).

(3) The waveguide probe is translated in a second direction along the Yaxis and perpendicular to the first direction to effect scanning of atleast a portion of the area surrounding fastener 200 a. This translationis indicated by arrow 320 a in FIG. 3.

(4) The platform is translated in the first direction, as indicated byarrow 310 b, until the waveguide probe is positioned in proximity tofastener 200 b in the upper row.

(5) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 b, which adjustments may comprise translation along oneor more of the X, Y and Z axes (not indicated by arrows in FIG. 3).

(6) The waveguide probe is translated in a third direction opposite tothe second direction to effect scanning of at least a portion of thearea surrounding fastener 200 b. This translation is indicated by arrow320 b in FIG. 3.

(7) The platform is translated in the first direction, as indicated byarrow 310 c, until the waveguide probe is positioned in proximity tofastener 200 c in the upper row.

(8) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 c, which adjustments may comprise translation along oneor more of the X, Y and Z axes (not indicated by arrows in FIG. 3).

(9) The waveguide probe is translated in the second direction to effectscanning of at least a portion of the area surrounding fastener 200 c.This translation is indicated by arrow 320 c in FIG. 3.

(10) The platform is translated in the second direction, as indicated byarrow 310 d, until the waveguide probe is positioned in proximity tofastener 200 d in the lower row.

(11) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 d, which adjustments may comprise translation along oneor more of the X, Y and Z axes (not indicated by arrows in FIG. 3).

(12) The waveguide probe is translated in the third direction to effectscanning of at least a portion of the area surrounding fastener 200 d.This translation is indicated by arrow 320 d in FIG. 3.

(13) The platform is translated in a fourth direction opposite to thefirst direction, as indicated by arrow 310 e, until the waveguide probeis positioned in proximity to fastener 200 e in the lower row.

(14) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 e, which adjustments may comprise translation along oneor more of the X, Y and Z axes (not indicated by arrows in FIG. 3).

(15) The waveguide probe is translated in the second direction to effectscanning of at least a portion of the area surrounding fastener 200 e.This translation is indicated by arrow 320 e in FIG. 3.

(16) The platform is translated in the fourth direction, as indicated byarrow 310 f, until the waveguide probe is positioned in proximity tofastener 200 f in the lower row.

(17) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 f, which adjustments may comprise translation along oneor more of the X, Y and Z axes (not indicated by arrows in FIG. 3).

(18) The waveguide probe is translated in the third second direction toeffect scanning of at least a portion of the area surrounding fastener200 f. This translation is indicated by arrow 320 f in FIG. 3.

(19) The platform is translated in the fourth direction, as indicated byarrow 310 g, until the waveguide probe is positioned in proximity to thenext fastener (not shown in FIG. 3) in the lower row.

Raster scanning the area around each fastener in a horizontal row isespecially useful in cases where the direction of surface-breakingcracks emanating from the fastener is parallel to the fastener row. Thecrawler vehicle (or other platform, such as a scanning bridge or arobotic arm) can be set at the first fastener in the row, and orientedso it can move along the fastener row. If needed, the Z-axis stage isadjusted so that the apertures of the waveguides are just above thesurface of the area to be inspected. The X- and Y-axis stages of themulti-stage probe placement head are then sequentially activated to movethe waveguide probe along a serpentine path to effect raster scanning ofthe area around the fastener. All signals are collected in a grid at Xand Y positions at a pre-selected spacing. Fasteners surrounded by anarea which produced wave signals above a predetermined threshold aretagged in the data set for repair and optionally marked with a pen orpaint marker dropped adjacent to the fastener (the threshold isdetermined using a reference standard with a range of cracks). Data(full wave form, maximum difference signal, fastener location number,and data tag indicating fasteners with crack indications) is collectedand stored for retrieval, analysis, or data manipulation, such as gatingfor maximum signal in order to size cracks. An image of the maximumdifference wave signal is created, displayed on a computer monitor, andstored for later retrieval. Then the platform is moved along thefastener row to the next fastener in the row. This process can berepeated until all fasteners in the row have been inspected and imaged.

FIG. 4 is a diagram showing two rows of fasteners 200 a-200 f. Thestraight arrows 410 a-410 g again indicate respective movements of thewaveguide probe during movement of the platform on which the waveguideprobe is mounted. The sets of oppositely directed short arrows 420 a-420f indicate successive rastered scans executed by the waveguide probe atsuccessive starting positions in proximity to the fasteners 200 a-200 f.These waveguide probe movements can be used when the crack direction isparallel to a horizontal line of the fuselage of an aircraft and whencomplete C-scan type images of the fastener heads are desired.

More specifically, steps of a method for scanning two rows of fastenersusing a millimeter waveguide probe, as partially depicted in FIG. 4, maycomprise the steps listed below. For purposes of this example only, theterm “start scan position” means that the probe center line is spacedapart from the diametral line which extends across the head of thefastener and is perpendicular to the horizontal line of the fuselage.

(1) The platform is translated in a first direction along the X axisparallel to the upper row of fasteners, as indicated by arrow 410 a,until the waveguide probe is positioned in proximity to fastener 200 ain the upper row.

(2) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 a, which adjustments may comprise translation along theZ axis (not indicated by an arrow in FIG. 4).

(3) The waveguide probe is alternatingly translated along the X and Yaxes so that it follows a serpentine path to effect a raster scan of thearea surrounding fastener 200 a. Only the back and forth translationsalong the Y axis are indicated by arrows 420 a in FIG. 4 (the connectingshort translations along the X axis are not shown).

(4) The platform is translated in the first direction, as indicated byarrow 410 b, until the waveguide probe is positioned in proximity tofastener 200 b in the upper row.

(5) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 b, which adjustments may comprise translation along theZ axis (not indicated by an arrow in FIG. 4).

(6) The waveguide probe is alternatingly translated along the X and Yaxes so that it follows a serpentine path to effect a raster scan of thearea surrounding fastener 200 b. Only the back and forth translationsalong the Y axis are indicated by arrows 420 b in FIG. 4.

(7) The platform is translated in the first direction, as indicated byarrow 410 c, until the waveguide probe is positioned in proximity tofastener 200 c in the upper row.

(8) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 c, which adjustments may comprise translation along theZ axis (not indicated by an arrow in FIG. 4).

(9) The waveguide probe is alternatingly translated along the X and Yaxes so that it follows a serpentine path to effect a raster scan of thearea surrounding fastener 200 c. Only the back and forth translationsalong the Y axis are indicated by arrows 420 c in FIG. 4.

(10) The platform is translated along the Y axis, as indicated by arrow410 d, until the waveguide probe is positioned in proximity to fastener200 d in the lower row.

(11) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 d, which adjustments may comprise translation along theZ axis (not indicated by an arrow in FIG. 4).

(12) The waveguide probe is alternatingly translated along the X and Yaxes so that it follows a serpentine path to effect a raster scan of thearea surrounding fastener 200 d. Only the back and forth translationsalong the Y axis are indicated by arrows 420 d in FIG. 4.

(13) The platform is translated along the X axis in a direction oppositeto the first direction, as indicated by arrow 410 e, until the waveguideprobe is positioned in proximity to fastener 200 e in the lower row.

(14) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 e, which adjustments may comprise translation along theZ axis (not indicated by an arrow in FIG. 4).

(15) The waveguide probe is alternatingly translated along the X and Yaxes so that it follows a serpentine path to effect a raster scan of thearea surrounding fastener 200 e. Only the back and forth translationsalong the Y axis are indicated by arrows 420 e in FIG. 4.

(16) The platform is translated along the X axis in a direction oppositeto the first direction, as indicated by arrow 410 f, until the waveguideprobe is positioned in proximity to fastener 200 f in the lower row.

(17) The position of the waveguide probe relative to the platform isadjusted to place the waveguide probe in a start scan position relativeto fastener 200 f, which adjustments may comprise translation along theZ axis (not indicated by an arrow in FIG. 4).

(18) The waveguide probe is alternatingly translated along the X and Yaxes so that it follows a serpentine path to effect a raster scan of thearea surrounding fastener 200 f. Only the back and forth translationsalong the Y axis are indicated by arrows 420 f in FIG. 4.

(19) The platform is translated in the direction opposite to the firstdirection, as indicated by arrow 410 g, until the waveguide probe ispositioned in proximity to the next fastener (not shown in FIG. 4) inthe lower row.

FIG. 5 is a block diagram identifying components of a millimeter wavecrack detection system in accordance with one embodiment. This systemcomprises a signal generator 512, an isolator 514, a signal divider 516and first and second waveguides 602, 604. The signal generator 512 isconfigured to generate first and second millimeter wave signals whichmay have different frequencies. Millimeter waves may have a frequencyfrom about 30 to about 300 GHz and a wavelength from about 1 to about 10mm. The first and second millimeter wave signals are received by thesignal divider 516, which passes the first signal to the first waveguide602 and the second signal to the second waveguide 604. The isolator 514is configured to reduce unwanted reflections from the signal divider 516to the signal generator 512.

The wave signals emitted by the waveguides 602, 604 will be reflected bythe metal structure, producing standing waves inside the waveguides.Still referring to FIG. 5, a characteristic (e.g., voltage) of thestanding waves inside the waveguides 602, 604 is detected by respectivediode detectors 522, 524. The detector outputs are collected by a dataacquisition device 526 and sent to a signal analyzer 528. The signalanalyzer 528 may be a processor programmed to identify a differencebetween the detector outputs and then determine whether an inconsistency(e.g., a crack) is present in the area around the fastener based on thatdifference.

The waveguide probe 504 depicted in FIG. 1 is shown on a magnified scalein FIG. 6. In this embodiment, the waveguide probe 504 comprises housing600 to which first waveguide 602 and second waveguide 604 are adjustablyconnected. Waveguide probe 504 has a first connector 606, which isconfigured for connection to signal generator 512 shown in FIG. 5.Waveguide probe 504 also has a second connector 608 and a thirdconnector 610. These two connectors are configured for connection to thedata acquisition device 526 shown in FIG. 5.

Bar 612 is connected to the first and second waveguides 602, 604.Adjusting screw 614 may be used to secure the first waveguide 602 to bar612 when the distance 616 between the first and second waveguides 602,604 has been selected. Distance 616 may be selected such that theapertures (not shown) at the end 618 of the first waveguide 602 and theend 620 of the second waveguide 604 are disposed over opposite sides ofa fastener. In this illustrative example, first waveguide 602 and secondwaveguide 604 have a length 622. In one implementation, length 622 maybe about 2 inches. In other implementations, length 622 may be in arange from about 1 inch to about 4 inches.

FIG. 7 is a diagram representing a plan view of an inconsistency 704emanating from a fastener 702 in a lap joint portion of a metallicfuselage skin 506. In this example, the inconsistency 704 is a crackextending in directions indicated by double-headed arrow 706 that isparallel to the row of fasteners to which fastener 702 belongs. Crackstypically extend in this direction due to the stresses and constructionof an aircraft fuselage. In the scenario depicted in FIG. 7, the head offastener 702 has diameter 708, while the inconsistency 704 has a length710 measured at the surface of fuselage skin 506.

FIG. 8 is a diagram representing a sectional view of the inconsistency704 emanating from the fastener 702. The fuselage skin 506 comprisesoverlapping metallic layers 104 and 106 which are fastened together by amultiplicity of fasteners. The fastener 702 is secured in aligned holesin layers 104, 106 by means of a nut 110.

FIG. 9 is a diagram illustrating movement of an open-ended waveguideprobe 504 over a fastener 702 in accordance with one embodiment. FIG. 9represents a cross-sectional view of waveguide probe 504 taken alonglines 9-9 in FIG. 6. In the embodiment depicted in FIG. 9, the opening900 in the first waveguide 602 is offset from the opening 902 in thesecond waveguide 604. This offset is with respect to line 905. Thisoffset may reduce a possibility of signals and/or responses interferingwith each other and indicating an inconsistency is absent in situationswhere inconsistencies are present on both sides of the fastener 702.

In this illustrative example, opening 900 has length 904 and width 906,and opening 902 has length 908 and width 910. In one implementation, thelengths 904 and 908 may be about 0.1 inch, and the widths 906 and 910may be about 0.05 inch. The waveguides 602, 604 have respectiverectangular cavities that extend upward from openings 900 and 902.However, other waveguide shapes may be used.

As illustrated in FIG. 9, the waveguide probe 504 may be moved in thedirection of arrow 912 with respect to the fastener 702. The firstwaveguide 602 with opening 900 and the second waveguide 604 with opening902 are shown in phantom in positions 914, 916, and 918. In thisillustrative example, inconsistency 704 extends outward from thefastener 702.

FIG. 10 is a diagram illustrating signals of a type that might beproduced by the waveguide probe 504 while scanning the fastener 702depicted in FIG. 9. The responses 1000 shown in FIG. 10 are examples ofrespective responses detected by first waveguide 602 and secondwaveguide 604 while in positions 914, 916, and 918 shown in FIG. 9. Inthis illustrative example, response 1002 is detected by first waveguide602, and response 1004 is detected by second waveguide 604 in position914; response 1006 is detected by first waveguide 602, and response 1008is detected by second waveguide 604 in position 916; and response 1010is detected by first waveguide 602 and response 1012 is detected bysecond waveguide 604 in position 918.

The difference signals 1001 shown in FIG. 10 represent the differencesbetween the respective responses detected by the first and secondwaveguides. Difference signal 1014 represents a substantially zerodifference between response 1002 and response 1004. Accordingly,difference signal 1014 indicates the absence of an inconsistency atposition 914. Difference signal 1016 represents the non-zero differencebetween response 1006 and response 1008. Difference signal 1016indicates that inconsistency 704 was detected when waveguide probe 504was at position 916. Difference signal 1018 represents a substantiallyzero difference between response 1010 and response 1012. Accordingly,the difference signal 1018 indicates the absence of an inconsistency atposition 918.

Thus, as waveguide probe 504 is moved relative to fastener 702, aninconsistency on either side may produce a detectable difference in theresponses detected by the first and second waveguides. These differencesmay be measured in terms of amplitude, phase, or a combination of thetwo. The offset in the openings may reduce the likelihood that adifference of zero will be produced if respective inconsistencies havingsimilar size and orientation are present on both sides of the fastener.

FIG. 11 is a diagram illustrating scanning of a portion of a metallicfuselage skin 506 having two inconsistencies 1102 and 1104 emanatingfrom respective sides 1106 and 1108 of a fastener 1100. For the purposeof illustration, it will be assumed that inconsistencies 1102 and 1104have similar dimensions and orientations. In this illustrative example,the offset between the openings of the waveguides may prevent responsesfrom indicating the absence of an inconsistency when the responsesignals from the respective inconsistencies 1102 and 1104 produce adifference signal less than the specified threshold. As can be seen inFIG. 11, when the waveguide probe is in position 1110, inconsistency1104 can be detected. Later, when the waveguide probe moves to position1112, inconsistency 1102 can be identified.

The illustration of waveguide probe 504 and inconsistencies on ametallic skin panel in FIGS. 5-11 are not meant to imply physical orarchitectural limitations to the manner in which waveguide probe 504 maybe implemented. Further, the manner in which waveguide probe 504 may bemoved with respect to metallic skin 506 may be performed in ways otherthan what is shown. For example, waveguide probe 504 may be rotatedaround each fastener, rather than moved in the direction of arrow 706.

FIG. 12 is a flowchart identifying steps of a process for inspecting astructure in accordance with one embodiment. This process may beimplemented in an inspection environment and using the equipmentdepicted in FIG. 1. The process begins by sending a first signal into afirst location in the metallic structure and a second signal into asecond location in the metallic structure at substantially the same time(operation 1200). The process receives a first response to the firstsignal and a second response to the second signal (operation 1202). Thefirst response is compared to the second response and a differencebetween the first and second responses is calculated (operation 1204). Adetermination is made as to whether the difference is greater than apre-selected threshold value considered to be indicative of the presenceof an inconsistency (operation 1206). If the difference is not greaterthan the pre-selected threshold value (i.e., an inconsistency is notpresent), the process terminates. Otherwise, an operation is performedon the inconsistency (operation 1208). The operation may be, forexample, a rework operation. The rework operation may include reworkingthe metallic structure to reduce or remove the inconsistency orreplacing the metallic structure. The process terminates thereafter.

FIG. 13 is a diagram representing an isometric view of parts of aholonomic-motion crawler vehicle that could be adapted to carry amulti-motion inspection head. More specifically, crawler vehicle 120depicted in FIG. 1 could be a holonomic-motion vehicle. A holonomicmotion system is one that is not subject to motion constraints. Thistype of system can translate in any direction while simultaneouslyrotating or rotate without translation.

FIG. 13 shows parts of a holonomic-motion crawler vehicle having fourMecanum wheels and two suction zones in accordance with one embodiment.The electrical connections for supplying signals for controllingoperation of the depicted components are not shown in FIG. 13. Thisholonomic-motion crawler vehicle comprises a frame 2 with four Mecanumwheels 4 (two type “A” and two type “B”) mounted to the frame 2 by meansof respective axles 6, and further comprises four independentlycontrolled stepper motors 8 (one per wheel). The Mecanum wheels 4 arearranged with the “A” pair on one diagonal and the “B” pair on the otherdiagonal, with each having its axle 6 perpendicular to a line runningthrough the center of the vehicle. Each stepper motor 8 controls therotation of a respective wheel 4.

The embodiment depicted in FIG. 13 also has two suction devices 10arranged side by side in the middle of the frame 2, midway between thefront and rear wheels. In this particular embodiment, each suctiondevice is a respective electric ducted fan (EDF) 10 which is mounted ina respective opening (not shown in FIG. 13) formed in the frame 2. Eachelectric ducted fan 10 comprises a fan which is rotatable about an axis,a duct surrounding the fan, and an electric motor which drives the fanto rotate in a direction such that air is propelled from a respectivechannel or space underneath the frame (hereinafter “suction zone”) upthrough the fan duct, thereby creating suction in the correspondingsuction zone. The two suction zones are bounded on opposing sides bylongitudinal low-surface-friction flexible skirts 14 a-14 c which areattached to the frame 2, the middle skirt 14 c forming a common boundarywall separating the two suction zones. The skirts 14 a-14 c may extenddownward so that their bottom edges contact the surface on which thevehicle is moving.

Although not shown in FIG. 13, the crawler vehicle can be tethered to asupport system by a cable which supplies electrical power to the steppermotors 8 and electric ducted fans 10 on the vehicle. The cable alsoprovides control signals from a controller (e.g., a computer) whichcontrols the operation of the stepper motors 8 and electric ducted fans10. The crawler vehicle further comprises a converter box (not shown)mounted to the frame 2. The converter box converts USB signals from thecontroller (not shown) into pulse-width-modulated signals forcontrolling the electric ducted fan motors.

In accordance with an alternative embodiment, the crawler vehicle couldbe battery-powered, instead of receiving electrical power via the tethercable. Also the motor controller could be a microprocessor ormicrocomputer mounted onboard the crawler vehicle, rather than using aground-based computer to control the vehicle by means of controlssignals carried by a tether cable. Alternatively, the motors onboard thecrawler vehicle can be controlled via a wireless connection to anoff-board controller.

The crawler vehicle shown in FIG. 13 utilizes four Mecanum wheels. EachMecanum wheel 4 has a multiplicity of tapered rollers 16 rotatablymounted to its circumference, each roller being freely rotatable aboutits axis. These rollers typically have an axis of rotation which lies ata 45° angle with respect to the plane of the wheel. Type “A” Mecanumwheels have left-handed rollers, while Type “B” Mecanum wheels haveright-handed rollers. The vehicle can be made to move in any directionand turn by varying the speed and direction of rotation of each wheel.

FIG. 14 is a diagram showing a bottom view of a Mecanum-wheeled crawlervehicle having dual suction zones 12 separated by a common skirt 14 cwhich bisects the bottom surface of the frame along a longitudinal axis.In this particular construction, the upper half of the bottom surfacebetween the uppermost skirt 14 a and the common skirt 14 c comprises aflat central surface 36 having an opening in which the fan of theelectric ducted fan is installed. This flat central surface 36 isflanked by forward and rearward convex surface 38 and 40. Each convexsurface 38 and 40 may be an aerodynamically streamlined surface whichforms a respective throat with opposing portions of the surface on whichthe vehicle is moving. Thus, the contoured bottom surface of the frame,the skirts and the surface on which the vehicle is moving definerespective channels that allow sufficient air to be sucked up throughthe corresponding electric ducted fan to generate a desired suctionforce. The portion of each channel between the lowest points of theconvex surfaces 38 and 40 forms a respective suction zone 12. In theparticular embodiment depicted in FIG. 14, the suction zones areseparated by the common skirt 14 c and are in fluid communication withthe respective openings in which the ducted fans are installed. Theseopenings may be substantially conical along a lowermost portion thereofto facilitate the flow of air out the suction zone.

It should be appreciated that the under-body surface shape seen in FIG.14 is an exemplary implementation. The under-body surface may have manydifferent shapes conducive to the flow of air from the front and rear ofthe vehicle through the space underneath the vehicle and then up throughthe ducts of the electric ducted fans 10.

The system disclosed herein combines the directional control advantagesof a Mecanum-wheeled crawler vehicle with the ability to work oninclined, vertical or inverted surfaces. As compared to inspectionsystems that attach to the inspection surface, or systems that use alarge robotic manipulator arm, a crawler vehicle has more flexibility inthe types of regions that can be inspected, and is safer for operatorsand the object being inspected. The main advantage that the systemdisclosed herein has over other systems is the combination of theability to hold the vehicle's position on any surface without sliding(due to the controlled suction system) and the ability to move in anydirection (due to the holonomic-motion platform). With aholonomic-motion system that can move on level, inclined and verticalsurfaces (and potentially inverted surfaces), general-purpose motioncontrol is enabled for millimeter wave crack detection.

FIG. 15 is a block diagram identifying components of an automated systemfor non-destructive inspection of metal around a fastener in accordancewith an embodiment wherein the platform is a holonomic-motion crawlervehicle equipped with a multi-stage probe placement head that supports arotatable millimeter waveguide probe. The probe placement head supportsa plurality of motors 60, three of which drive translation of thewaveguide probe 504 along X, Y and Z axes respectively and one of whichdrives rotation of the waveguide probe 504 about the Z axis. Theholonomic-motion crawler vehicle depicted in FIGS. 13 and 14 carriesfour wheel motors 70, which respectively drive rotation of four Mecanumwheels, and two EDF motors 80 which drive rotation of two electricducted fans. All of the motors 60, 70 and 80 received electrical powerfrom power supplies 56 via switches on a relay board 54. The states ofthose switches are controlled by a computer 50. More specifically, theclosure of a switch on relay board 54 is activated by a signal receivedfrom computer 50 via a serial (e.g., RS-232) port interface 52. Thecomputer 50 may comprise a general-purpose computer programmed withmotion control application software comprising respective softwaremodules for controlling the various stepper motors. The computer 50outputs control signals to probe placement head motors 60 and wheelmotors 70 via the same serial port interface 52 to selectivelyactivate/deactivate each motor. When activated, the stepper motors areprogrammed to execute respective motion control functions in accordancewith selections made by the system operator using an interactive controlinterface (not shown).

The holonomic-motion crawler vehicle may be equipped with a video camera190 that captures a live view of the volume of space below the probeplacement head. The video camera 190 receives power from a power supplyin response to activation of a switch that is part of relay board 54 andactivated by computer 50 via serial port interface 52. Imaging data fromvideo camera 190 is received by a display monitor 64 via a camera switch62. The imaging data is also sent to the computer 50 for imageprocessing, e.g., using pattern recognition software.

The computer 50 may also be programmed to control the signal generator512 to generate millimeter wave signals inside the waveguide probe 504.The detector outputs from the waveguide probe 504 are collected by adata acquisition device 526 and sent to computer 50, which is furtherprogrammed with signal analyzing software. The signal analyzing softwarecan identify a difference between the detector outputs and thendetermine whether an inconsistency (e.g., a crack) is present in thearea being inspected.

In accordance with one embodiment of the system depicted in FIG. 1,probe placement head 100 comprises: a Z-axis stage 140 that isdisplaceable along a Z axis relative to the block assembly 130; anX-axis stage 150 that is displaceable along an X axis relative to theZ-axis stage 140; and a Y-axis stage 160 that is displaceable along a Yaxis relative to the X-axis stage 150. The X-, Y- and Z-axis stages maybe translatably coupled by means of respective linear-motion bearings.These translatable stages may be mechanically coupled to respectivestepper motors (see probe placement head motors 60 in FIG. 15) by anysuitable drive mechanism known in the art. For example, each stage couldhave a respective attached nut which threadably engages a respectivelead screw which is driven to rotate by a respective stepper motor,thereby converting the rotation of the motor output shaft intotranslation of the stage.

In accordance with some alternative embodiments, the apparatus maycomprise a multi-stage probe placement head comprising a block assembly,a first stage translatably coupled to the block assembly, and a secondstage translatably coupled to the first stage; a mandrel rotatablycoupled to the second stage of the multi-stage probe placement head; anda millimeter waveguide probe attached to the mandrel. For example, ifthe multi-stage probe placement head is mounted on a crawler vehicle,robotic arm or scanning bridge that can be positioned with sufficientprecision along a X axis which is parallel to a row of fasteners, then atwo-stage probe placement head could be provided which has a Y-axisstage and a Z-axis stage, both of which are controllable to enableprecise positioning in the Y and Z directions. Accordingly, probeplacements heads within the scope of the teachings herein may have onlytwo translating stages in some applications.

In accordance with other alternative embodiments, an eddy current probemounted in front of the waveguide probe may be used to locate a fastener(instead of relying on camera images). The eddy current probe can centerelectrically on a fastener. Since the position of the eddy current probein the frame of reference of the platform is known, the position of thefastener in that same frame of reference could be determined from theeddy current probe output. The waveguide probe could then be positionedto align with that fastener.

While apparatus and methods for inspecting metal around fasteners havebeen described with reference to various embodiments, it will beunderstood by those skilled in the art that various changes may be madeand equivalents may be substituted for elements thereof withoutdeparting from the scope of the teachings herein. In addition, manymodifications may be made to adapt the concepts and reductions topractice disclosed herein to a particular situation. Accordingly, it isintended that the subject matter covered by the claims not be limited tothe disclosed embodiments.

As used in the claims, the term “computer system” should be construedbroadly to encompass a system having at least one computer or processor,and which may have multiple computers or processors that communicatethrough a network or bus. As used in the preceding sentence, the terms“computer” and “processor” both refer to devices comprising a processingunit (e.g., a central processing unit, an integrated circuit or anarithmetic logic unit) capable of executing instructions.

In one or more of the applications disclosed herein, a first programcomprises instructions for processing imaging data using patternrecognition; a second program comprises instructions for controlling amotorized multi-stage probe placement head, a third program comprisesinstructions for controlling a millimeter waveguide probe, and a fourthprogram comprises instructions for analyzing signals received from themillimeter waveguide probe.

The method claims set forth hereinafter should not be construed torequire that the steps recited therein be performed in alphabeticalorder (any alphabetical ordering in the claims is used solely for thepurpose of referencing previously recited steps) or in the order inwhich they are recited. Nor should they be construed to exclude anyportions of two or more steps being performed concurrently oralternatingly. For example, translation of two or more stages may occurconcurrently or sequentially or may partially overlap in time.

The invention claimed is:
 1. A method for non-destructive inspection ofmetal around a fastener, comprising: (a) controlling motors of aplatform to move the platform to a position whereat a waveguide probemovably coupled to the platform by a multi-stage probe placement head isin proximity to a fastener; (b) while the platform and waveguide probeare stationary, acquiring image data using a camera having a field ofview that includes the fastener; (c) processing the image data todetermine a position of a centerline of the fastener in a frame ofreference of the platform; (d) determining a difference between thecurrent position and a start position of the waveguide probe in theframe of reference of the platform based on the position of thecenterline of the fastener in the frame of reference of the platform;(e) while the platform is stationary, controlling motors of themulti-stage probe placement head to move the waveguide probe from thecurrent position to the start position of the waveguide probe; and (f)while the platform is stationary, scanning at least a portion of an areaaround the fastener using the waveguide probe by controlling the motorsof the multi-stage probe placement head to move the waveguide probe andcontrolling a signal generator to supply first and second millimeterwave signals to first and second waveguides of the waveguide probe. 2.The method as recited in claim 1, wherein a vertical axis midway betweentwo apertures of the waveguide probe is approximately coaxial with avertical axis through a center of the fastener when the waveguide probeis in the start position.
 3. The method as recited in claim 2, whereinstep (f) comprises rotating the waveguide probe.
 4. The method asrecited in claim 1, wherein a vertical axis midway between two aperturesof the waveguide probe is separated from a vertical axis through acenter of the fastener when the waveguide probe is in the startposition.
 5. The method as recited in claim 4, wherein step (f)comprises translating the waveguide probe in a horizontal direction sothat the vertical axis of the waveguide probe moves in a vertical planewhich intersects the fastener.
 6. The method as recited in claim 4,wherein step (f) comprises translating the waveguide probe horizontallyso that the vertical axis of the waveguide probe follows a serpentinepath in an area that includes the fastener.
 7. The method as recited inclaim 1, wherein step (c) comprises processing the image data using acomputer programmed with pattern recognition software.
 8. The method asrecited in claim 1, wherein step (f) comprises detecting acharacteristic of standing waves inside the first waveguide to generatea first detector output and detecting a characteristic of standing wavesinside the second waveguide to generate a second detector output, themethod further comprising analyzing the first and second detectoroutputs using a computer programmed to identify a difference between thefirst and second detector outputs and then determine whether aninconsistency is present in an area around the fastener based on thedifference.
 9. The method as recited in claim 8, further comprising:determining whether the difference is greater than a pre-selectedthreshold value considered to be indicative of the presence of aninconsistency or not; performing a rework operation on the inconsistencyif the difference is greater than the pre-selected threshold value. 10.A method for non-destructive inspection of metal around a fastener,comprising: (a) moving a holonomic-motion crawler vehicle under computercontrol to a position whereat a waveguide probe movably coupled to theholonomic-motion crawler vehicle is in proximity to a fastener; (b)while the holonomic-motion crawler vehicle and waveguide probe arestationary, acquiring image data using a camera mounted to theholonomic-motion crawler vehicle and having a field of view thatincludes the fastener; (c) processing the image data to determine aposition of a centerline of the fastener in a frame of reference of theholonomic-motion crawler vehicle; (d) determining a difference betweenthe current position and a start position of the waveguide probe in theframe of reference of the holonomic-motion crawler vehicle based on theposition of the centerline of the fastener in the frame of reference ofthe holonomic-motion crawler vehicle; (e) while the holonomic-motioncrawler vehicle is stationary, moving the waveguide probe under computercontrol from the current position to the start position of the waveguideprobe; and (f) while the holonomic-motion crawler vehicle is stationary,scanning an area around the fastener using the waveguide probe startingat the start position.
 11. The method as recited in claim 10, furthercomprising: (g) collecting wave signals from first and second waveguidesof the waveguide probe during scanning; and (h) processing the collectedwave signals to determine if those wave signals indicate a crack ispresent in the area around the fastener.
 12. The method as recited inclaim 11, wherein step (h) comprises analyzing the collected wavesignals using a computer programmed to identify a difference between thecollected wave signals from the first waveguide and the collected wavesignals from the second waveguide and then determine whether thedifference is greater than a specified threshold.
 13. The method asrecited in claim 12, further comprising performing a rework operation onthe inconsistency if the difference is greater than the pre-selectedthreshold value.
 14. The method as recited in claim 10, wherein step (f)comprises one of the following: rotating the waveguide probe;translating the waveguide probe in a horizontal direction so that thevertical axis of the waveguide probe moves in a vertical plane whichintersects the fastener or translating the waveguide probe horizontallyso that the vertical axis of the waveguide probe follows a serpentinepath in an area that includes the fastener.
 15. The method as recited inclaim 10, wherein a vertical axis midway between two apertures of thewaveguide probe is approximately coaxial with a vertical axis through acenter of the fastener when the waveguide probe is in the startposition.
 16. The method as recited in claim 15, wherein step (f)comprises rotating the waveguide probe.
 17. The method as recited inclaim 10, wherein a vertical axis midway between two apertures of thewaveguide probe is separated from a vertical axis through a center ofthe fastener when the waveguide probe is in the start position.
 18. Themethod as recited in claim 17, wherein step (f) comprises translatingthe waveguide probe in a horizontal direction so that the vertical axisof the waveguide probe moves in a vertical plane which intersects thefastener.
 19. The method as recited in claim 17, wherein step (f)comprises translating the waveguide probe horizontally so that thevertical axis of the waveguide probe follows a serpentine path in anarea that includes the fastener.
 20. The method as recited in claim 10,wherein step (c) comprises processing the image data using a computerprogrammed with pattern recognition software.